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Memoirs of the Faculty of Engineering, Yamaguchi University Volume 48 Issue 2
published_at 1998
A redundant fault identification method for sequential circuits based on implication procedure
含意操作に基づく順序回路の冗長故障判定
Fujimoto Yukihiro
Watanabe Takahiro
fulltext
701 KB
KJ00000157130.pdf
About This Article
Descriptions
論理回路の冗長故障は, 回路の故障検査(テスト)では検出できない故障であり, これをあらかじめ検査項目の故障リストから除いておくことは効率的なテスト生成に欠かせない。そこで, 本研究では, 特に回路が複雑になる順序回路に対して, 2種類の効率的な冗長故障判定方法の検討を行う。我々はこれらの2種類の方法を実装し, ISCAS'89ベンチマーク回路を用いて実験を行った。その結果, 冗長故障判定を行わない時と比較して, テスト生成全体の効率を向上させることが確認できた。
Creator Keywords
Test generation
Redundant faults
Implication procedure
Chen method
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