Tl_2S and PbS low vacuum evaporated thin films have been used for detector of light in the visible and infrared region up to this time. Therefore by mixing up these substance and by evaporating in high vacuum chamber, we checked up the sensitive region and photoelectrical characteristics and by X-ray diffraction and electronic microscopic photograph, we could make clear variation of the construction of thin film's surface after activation process. In addition to these experiments, we measured the distribution of thickness with evaporated Tl_2S thin film.