Contents Menu

Phenomenon of end of life in a fluorescent lamp under high-frequency operation

Journal of the Illuminating Engineering Institute of Japan Volume 87 Issue 8A Page 566-575
published_at 2003-08
2007010068.pdf
[fulltext] 2.15 MB
Title
高周波点灯時における蛍光ランプの寿命末期現象
Phenomenon of end of life in a fluorescent lamp under high-frequency operation
Creators Myojo Minoru
Creators Fukumasa Osamu
Creator Keywords
fluorescent lamp end of lamp life (EOLL) emissive material (coating) depletion electrode filament electronic ballast electron emission alkali metal adsorption adsorbate
The mechanism that causes the end of lamp life (EOLL) phenomenon in a fluorescent lamp should be clarified to better understand the EOLL. The phenomenon, including the tungsten sputtering from an electrode, is investigated. We observed the electron emission from a lead in the vicinity of the stem glass resulting in the intermittent pulse discharge that heated up the stem glass. The comparison of the stem glass resistance and the glow discharge impedance at an interval of leads after disconnection of the filament indicates whether or not the stem glass will begin to soften. It was shown that the heating of a small glass portion around the lead by the intermittent pulse discharge or the concentration of discharge current into one of leads was a dominant factor that resulted in the final stage of EOLL..
Subjects
電気電子工学 ( Other)
Languages jpn
Resource Type journal article
Publishers 照明学会
Date Issued 2003-08
File Version Version of Record
Access Rights open access
Relations
[ISSN]0019-2341
[NCID]AN00268860
[isPartOf] [URI]http://ci.nii.ac.jp/vol_issue/nels/AN00268860_jp.html
Schools 大学院理工学研究科(工学)