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A method for generating tests in combinational circuits by structure description functions

The transactions of the Institute of Electronics and Communication Engineers of Japan. D Volume 64 Issue 8 Page 690-696
published_at 1981-8
2013010117.pdf
[fulltext] 1.33 MB
Title
構造記述関数を用いた組合せ回路の故障検査について
A method for generating tests in combinational circuits by structure description functions
Creators Kinoshita Kozo
Creators Takamatsu Yuzo
Creators Shibata Masaharu
Creators Matsufuji Shinya
Languages jpn
Resource Type journal article
Date Issued 1981-8
Rights
copyright(c)1981 IEICE()
File Version Version of Record
Access Rights open access
Relations
[ISSN]0374-468X
[NCID]AN00153326
[isVersionOf] [URI]http://search.ieice.org/index.html
Schools 大学院理工学研究科(工学)