A high accuracy depth measurement by a hierarchical phase shifting method
        The transactions of the Institute of Electronics, Information and Communication Engineers. D-II Volume J83-D2 Issue 9
        Page 1962-1965
        
    published_at 2000-09-25
            Title
        
        階層化位相シフト法による高精度な奥行き計測
        A high accuracy depth measurement by a hierarchical phase shifting method
        
    
            Creator Keywords
        
            レンジファインダ
            液晶プロジェクタ
            距離画像
            三角測量
            階層処理
    
        
            Languages
        
            jpn
    
    
        
            Resource Type
        
        journal article
    
    
        
            Publishers
        
            電子情報通信学会情報・システムソサイエティ
    
    
        
            Date Issued
        
        2000-09-25
    
    
            Rights
        
            copyright(c)2000 IEICE()
    
        
            File Version
        
        Version of Record
    
    
        
            Access Rights
        
        open access
    
    
            Relations
        
            
                
                
                [ISSN]0915-1923
            
            
                
                
                [NCID]AA11340957
            
            
                
                
                [NCID]AA11512305
            
            
                [isVersionOf]
                
                [URI]http://search.ieice.org/index.html
            
    
