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Tamura Yoshinobu

Affiliate Master Yamaguchi University

Reliability assessment based on hazard rate model for an embedded OSS porting-phase

Software testing, verification & reliability Volume 23 Issue 1 Page 77-88
published_at 2013-01
Title
Reliability assessment based on hazard rate model for an embedded OSS porting-phase
Creators Tamura Yoshinobu
Creators Yamada Shigeru
Creator Keywords
reliability embedded system open source software modeling
Languages eng
Resource Type journal article
Publishers Wiley
Date Issued 2013-01
File Version Not Applicable (or Unknown)
Access Rights metadata only access
Relations
[ISSN]0960-0833
[ISSN]1099-1689
[NCID]AA1101041X
[NCID]AA11627500
info:doi/10.1002/stvr.455
[isVersionOf] [URI]http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1099-1689
Schools 大学院理工学研究科(工学)