Asahi Takanao
Affiliate Master
Yamaguchi University
Single Crystal X-ray Diffraction Measurements at High Pressure and Low Temperature
Center of Instrumental Analysis, Yamaguchi University Volume 10
Page 6-11
published_at 2002
Title
<研究報告>低温高圧下における単結晶X線回折実験技術の開発と適用
Single Crystal X-ray Diffraction Measurements at High Pressure and Low Temperature
Creators
Moriwake Satoshi
Creators
Kawamura Yukihiko
Creators
Hasebe Katsuhiko
Source Identifiers
We have been developing experimental and data analysis techniques for single crystal X-ray diffraction measurements at high pressure and low temperature using 18kW X-ray generator, off-center type four-circle goniometer, He-gas cryostat and diamond anvil cell. Results for CsH_2PO_4,which has pressure-induced antiferroelectric phase below 125K and above 0.33GPa, are presented.
Languages
jpn
Resource Type
departmental bulletin paper
Publishers
山口大学機器分析センター
Date Issued
2002
File Version
Version of Record
Access Rights
open access
Relations
[NCID]AN1046804X
Schools
機器分析センター