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Miike Hidetoshi

Affiliate Master Yamaguchi University

A high accuracy depth measurement by a hierarchical phase shifting method

The transactions of the Institute of Electronics, Information and Communication Engineers. D-II Volume J83-D2 Issue 9 Page 1962-1965
published_at 2000-09-25
2011010137.pdf
[fulltext] 549 KB
Title
階層化位相シフト法による高精度な奥行き計測
A high accuracy depth measurement by a hierarchical phase shifting method
Creators Tsukamoto Sosuke
Creators Wu Ben-yao
Creators Koga Kazutoshi
Creators Miike Hidetoshi
Creator Keywords
レンジファインダ 液晶プロジェクタ 距離画像 三角測量 階層処理
Languages jpn
Resource Type journal article
Publishers 電子情報通信学会情報・システムソサイエティ
Date Issued 2000-09-25
Rights
copyright(c)2000 IEICE()
File Version Version of Record
Access Rights open access
Relations
[ISSN]0915-1923
[NCID]AA11340957
[NCID]AA11512305
[isVersionOf] [URI]http://search.ieice.org/index.html
Schools 教育学部 大学院理工学研究科(工学)