Miike Hidetoshi
Affiliate Master
Yamaguchi University
A high accuracy depth measurement by a hierarchical phase shifting method
The transactions of the Institute of Electronics, Information and Communication Engineers. D-II Volume J83-D2 Issue 9
Page 1962-1965
published_at 2000-09-25
Title
階層化位相シフト法による高精度な奥行き計測
A high accuracy depth measurement by a hierarchical phase shifting method
Creator Keywords
レンジファインダ
液晶プロジェクタ
距離画像
三角測量
階層処理
Languages
jpn
Resource Type
journal article
Publishers
電子情報通信学会情報・システムソサイエティ
Date Issued
2000-09-25
Rights
copyright(c)2000 IEICE()
File Version
Version of Record
Access Rights
open access
Relations
[ISSN]0915-1923
[NCID]AA11340957
[NCID]AA11512305
[isVersionOf]
[URI]http://search.ieice.org/index.html