Single Crystal X-ray Diffraction Measurements at High Pressure and Low Temperature

<研究報告>低温高圧下における単結晶X線回折実験技術の開発と適用

Single Crystal X-ray Diffraction Measurements at High Pressure and Low Temperature

Creators Asahi Takanao

Creators Moriwake Satoshi

Creators Kawamura Yukihiko

Creators Hasebe Katsuhiko

We have been developing experimental and data analysis techniques for single crystal X-ray diffraction measurements at high pressure and low temperature using 18kW X-ray generator, off-center type four-circle goniometer, He-gas cryostat and diamond anvil cell. Results for CsH_2PO_4,which has pressure-induced antiferroelectric phase below 125K and above 0.33GPa, are presented.

[NCID]AN1046804X