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Study of defect structure in GaN layer using electron microscopy

published_at 2017
DT12100729_Abstract.pdf
[abstract] 5.01 MB
DT12100729_FullText.pdf
[fulltext] 34.1 MB
Title
電子顕微鏡を用いたGaN層中の欠陥構造に関する研究
Study of defect structure in GaN layer using electron microscopy
Degree 博士(工学) Dissertation Number 理工博甲第729号 (2017-09-29)
Degree Grantors Yamaguchi University
[kakenhi]15501 grid.268397.1
Creators 松原 徹
Languages jpn
Resource Type doctoral thesis
Date Issued 2017
File Version Not Applicable (or Unknown)
Access Rights open access
Schools 大学院理工学研究科