Study of defect structure in GaN layer using electron microscopy
published_at 2017
Title
電子顕微鏡を用いたGaN層中の欠陥構造に関する研究
Study of defect structure in GaN layer using electron microscopy
Degree
博士(工学)
Dissertation Number
理工博甲第729号
(2017-09-29)
Degree Grantors
Yamaguchi University
[kakenhi]15501
grid.268397.1
Creators
松原 徹
Languages
jpn
Resource Type
doctoral thesis
Date Issued
2017
File Version
Not Applicable (or Unknown)
Access Rights
open access
Schools
大学院理工学研究科